张祥朝副研究员

发布时间:2013-04-01     访问次数:

最终学历: 研究生

职 称: 副研究员

电 话: 021-51630347

学  位 :博士

职 务 / 传 真 :021-65641344

所在院系: 信息学院 

E-mail :zxchao@fudan.edu.cn

通信地址(邮编): 复旦大学江湾校区先进材料楼405室

讲授的主要课程:

本科专业基础课《应用光学》主讲,每周四学时,已讲授两届,每届40人。

本科必修基础课《线性代数》主讲,每周四学时,讲授一届,40人。

本科专业必修课《数学物理方法》助教,每周五学时,讲授一届,25人。

研究生选修课《Modern Optical Design》助教,每周三学时,讲授一届,20人。

承担课题:

1, 《超精密光学自由曲面面形误差评定算法的研究》,国家自然科学基金,2013.02-2015.12, 负责人

2, 《结构光学元件表面形貌评定研究》,上海市自然科学基金,2012.10-2015.09, 负责人

3,《IC装备超精密光学零部件制造研究与平台建设项目》,重大专项,2011.01-2013.12, 主要研究人员

发表论文:

1. X Zhang and X Jiang*. Numerical analyses of the boundary effect of radial basis functions in 3D surface reconstruction. Numerical Algorithms, 2008; 47(4): 327-339

2. X Zhang,X Jiang, and P J Scott. A new free-form surface fitting method for precision coordinate metrology. Wear, 2009; 266(5-6):543-547

3. X Jiang, X Zhang and P J Scott. Template matching of freeform surfaces based on orthogonal distance fitting for precision metrology. Measurement Science and Technology 2010; 21(4) 045101

4. X Zhang, X Jiang and P J Scott. Minimum zone evaluation of the form errors of quadric surfaces. Precision Engineering, 2011; 35(2): 383-389

5. X Zhang, X Jiang and P J Scott. A reliable method of minimum zone evaluation of cylindricity and conicity. Precision Engineering, 2011; 35(3):484-4896. X Zhang, X Jiang and P J Scott. A minimax fitting algorithm for ultra-precision aspheric surfaces. Journal of Physics: Conference Series 2011;311(1):012031

7. S Yang,X Zhang and M Xu. Analysis and optimization of tooth shapes of roll stampers for optical micro-structured array imprinting. Proceedings of SPIE. 2012;8416:84161J

8. H Xu, X Zhang, M Xu and X Li. Study on the control of surface roughness in single point diamond turning. Proceedings of SPIE. 2012;8416:84161D

9. X Zhang, X Jiang, AB Forbes, HD Minh and PJ Scott. Form error evaluation of simple geometries using the primal-dual interior point method. Proc. I Mech E, B, in press

10.X Zhang, M Xu, H Zhang, X He and X Jiang. Chebyshev fitting of complex surfaces for precision metrology. Measurement, in press